Hell's Kitchen, Paperback

Hell's Kitchen Paperback

Part of the John Pellam Thrillers series

5 out of 5 (1 rating)


Every New York City neighbourhood has a story, but what John Pellam uncovers in Hell's Kitchen has a darkness all its own. The Hollywood location scout is hoping to capture the unvarnished memories of longtime Kitchen residents in a no-budget documentary film.

But when a suspicious fire ravages an elderly woman's crumbling tenement, Pellam realises that someone might want the past to stay buried.

As more buildings and lives go up in flames, Pellam takes to the streets, seeking the twisted pyromaniac who sells services to the highest bidder. But Pellam is unaware that the fires are merely flickering preludes to the arsonist's ultimate masterpiece - a conflagration of nearly unimaginable proportions...


  • Format: Paperback
  • Pages: 368 pages, n/a
  • Publisher: Hodder & Stoughton General Division
  • Publication Date:
  • Category: Crime & mystery
  • ISBN: 9780340818800



Free Home Delivery

on all orders

Pick up orders

from local bookshops


Showing 1 - 1 of 1 reviews.

Review by

Hell’s Kitchen is the third (and so far final) Jeffrey Deaver Location Scout novel. Whilst doing research in Hell’s Kitchen, Pellam is caught in the fire that burns down a tenement building. The prime suspect is Ettie Wilkes Washington, the old black woman he has been interviewing for his oral history of Hell’s Kitchen. Convinced of her innocence, Pellam starts his own investigation. He mixes it with fire marshals, street kids, youth outreach workers, jaded lawyers, Latino and Irish gangs, land developers, high society and a pyromaniac. Who is telling the truth, and what are cleverly fabricated lies? Is anyone, including Pellam, being completely honest? Once again, plenty of twists in the tale, leading to a dramatic conflagration. An excellent Location Scout novel with room for sequels if Deaver decides to revisit this reluctant hero.

Also by Jeffery Deaver   |  View all

Also in the John Pellam Thrillers series   |  View all