Advanced Mathematical And Computational Tools In Metrology And Testing Xi Hardback
Edited by Alistair B (National Physical Lab, Uk) Forbes, Anna G (D.i. Mendeleev All-russian Institute For Metrology (Vniim), Russia) Chunovkina, Sascha (Physico-technical Federal Institute, Germany) Eichstadt, Nien Fan (Nat'l Inst Of Standards & Technology (Nist), Usa) Zhang
Part of the Series on Advances in Mathematics for Applied Sciences series
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing.
They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde.
The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data.
Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.
- Format: Hardback
- Pages: 460 pages
- Publisher: World Scientific Publishing Co Pte Ltd
- Publication Date: 20/08/2002
- Category: Applied mathematics
- ISBN: 9789813274297