Reliability Wearout Mechanisms in Advanced CMOS Technologies Hardback
by Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch
Part of the IEEE Press Series on Microelectronic Systems series
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results.
Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place.
Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
- Format: Hardback
- Pages: 624 pages
- Publisher: John Wiley & Sons Inc
- Publication Date: 05/08/2009
- Category: Circuits & components
- ISBN: 9780471731726