Terrestrial Neutron-induced Soft Error In Advanced Memory Devices Hardback
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues.
Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
- Format: Hardback
- Pages: 368 pages
- Publisher: World Scientific Publishing Co Pte Ltd
- Publication Date: 03/04/2008
- Category: Storage media & peripherals
- ISBN: 9789812778819