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VLSI Test Principles and Architectures : Design for Testability, PDF eBook

VLSI Test Principles and Architectures : Design for Testability PDF

PDF

Please note: eBooks can only be purchased with a UK issued credit card and all our eBooks (ePub and PDF) are DRM protected.

Description

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

  • Most up-to-date coverage of design for testability.
  • Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
  • Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

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