Nanometer Technology Designs : High-Quality Delay Tests Hardback
by Nisar Ahmed
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges.
Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.
This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
- Format: Hardback
- Pages: 281 pages, 40 Tables, black and white; 140 Illustrations, black and white; XVIII, 281 p. 140 illus.
- Publisher: Springer-Verlag New York Inc.
- Publication Date: 20/12/2007
- Category: Nanotechnology
- ISBN: 9780387764863
- PDF from £101.58
- Paperback / softback from £103.85