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Nanometer Technology Designs : High-Quality Delay Tests, Hardback Book

Nanometer Technology Designs : High-Quality Delay Tests Hardback

Description

Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges.

Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.

This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

Information

  • Format: Hardback
  • Pages: 281 pages, 40 Tables, black and white; 140 Illustrations, black and white; XVIII, 281 p. 140 illus.
  • Publisher: Springer-Verlag New York Inc.
  • Publication Date:
  • Category: Nanotechnology
  • ISBN: 9780387764863

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