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Aberration-Corrected Analytical Transmission Electron Microscopy, Hardback Book

Aberration-Corrected Analytical Transmission Electron Microscopy Hardback

Edited by Rik Brydson

Part of the RMS - Royal Microscopical Society series


The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration.

The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology.

This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).


  • Format: Hardback
  • Pages: 296 pages
  • Publisher: John Wiley & Sons Inc
  • Publication Date:
  • Category: Microscopy
  • ISBN: 9780470518519



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