Thermal-Aware Testing of Digital VLSI Circuits and Systems Hardback
This book aims to highlight the research activities in the domain of thermal-aware testing.
Thermal-aware testing can be employed both at circuit level and at system level.
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
- Format: Hardback
- Pages: 118 pages, 10 Illustrations, black and white
- Publisher: Taylor & Francis Inc
- Publication Date: 30/04/2018
- Category: Electrical engineering
- ISBN: 9780815378822