Fundamentals of Modern VLSI Devices Hardback
by Yuan (University of California, San Diego) Taur, Tak H. Ning
Hardback
Description
A thoroughly updated third edition of an classic and widely adopted text, perfect for practical transistor design and in the classroom.
Covering a variety of recent developments, the internationally renowned authors discuss in detail the basic properties and designs of modern VLSI devices, as well as factors affecting performance.
Containing around 25% new material, coverage has been expanded to include high-k gate dielectrics, metal gate technology, strained silicon mobility, non-GCA (Gradual Channel Approximation) modelling of MOSFETs, short-channel FinFETS, and symmetric lateral bipolar transistors on SOI.
Chapters have been reorganized to integrate the appendices into the main text to enable a smoother learning experience, and numerous additional end-of-chapter homework exercises (+30%) are included to engage students with real-world problems and test their understanding.
A perfect text for senior undergraduate and graduate students taking advanced semiconductor devices courses, and for practicing silicon device professionals in the semiconductor industry.
Information
-
Less than 10 available - usually despatched within 24 hours
- Format:Hardback
- Pages:622 pages, Worked examples or Exercises
- Publisher:Cambridge University Press
- Publication Date:02/12/2021
- Category:
- ISBN:9781108480024
Information
-
Less than 10 available - usually despatched within 24 hours
- Format:Hardback
- Pages:622 pages, Worked examples or Exercises
- Publisher:Cambridge University Press
- Publication Date:02/12/2021
- Category:
- ISBN:9781108480024
