Advanced Mathematical And Computational Tools In Metrology And Testing Ix PDF
Edited by Pavese Franco Pavese, Baer Markus Baer, Filtz Jean-remy Filtz, Forbes Alistair B Forbes, Pendrill Leslie Pendrill, Shirono Kastsuhiro Shirono
Part of the Series On Advances In Mathematics For Applied Sciences series
Please note: eBooks can only be purchased with a UK issued credit card and all our eBooks (ePub and PDF) are DRM protected.
Description
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Goteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Information
-
Download - Immediately Available
- Format:PDF
- Pages:468 pages
- Publisher:World Scientific Publishing Company
- Publication Date:27/03/2012
- Category:
- ISBN:9789814397964
Information
-
Download - Immediately Available
- Format:PDF
- Pages:468 pages
- Publisher:World Scientific Publishing Company
- Publication Date:27/03/2012
- Category:
- ISBN:9789814397964
