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ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis, Paperback / softback Book

ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis Paperback / softback

Paperback / softback

Available to Order - This title is available to order, with delivery expected within 2 weeks

Description

The theme for the November 2017 conference is Striving for 100% Success Rate.

Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

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£143.00

Available to Order - This title is available to order, with delivery expected within 2 weeks
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