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Handbook of Silicon Semiconductor Metrology PDF
Edited by Alain C. Diebold
Description
Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs,this reference surveys key areas such as optical measurements and in-line calibration methods.
It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay
Information
-
Download - Immediately Available
- Format:PDF
- Pages:896 pages
- Publisher:Taylor & Francis Inc
- Publication Date:29/06/2001
- Category:
- ISBN:9780203904541
Information
-
Download - Immediately Available
- Format:PDF
- Pages:896 pages
- Publisher:Taylor & Francis Inc
- Publication Date:29/06/2001
- Category:
- ISBN:9780203904541