Advances in X-Ray Analysis : Volume 28 Hardback
Edited by Charles S. Barrett, Paul K. Predecki
Hardback
Description
The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence.
Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique.
J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory.
J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories.
The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories.
Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics.
Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.
Information
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Item not Available
- Format:Hardback
- Pages:408 pages, 408 p.
- Publisher:Springer Science+Business Media
- Publication Date:30/06/1985
- Category:
- ISBN:9780306419393
Information
-
Item not Available
- Format:Hardback
- Pages:408 pages, 408 p.
- Publisher:Springer Science+Business Media
- Publication Date:30/06/1985
- Category:
- ISBN:9780306419393
