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High Resolution X-Ray Diffractometry And Topography, PDF eBook

High Resolution X-Ray Diffractometry And Topography PDF

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The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials.

This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production.

It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography.

It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization

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