Characterization of Semiconductor Materials, Volume 1 : Principles and Methods Volume 1 Hardback
by Gary F. (MCNC, Electronic Technologies Division, Research Triangle Park, NC) McGuire
Hardback
Description
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series.
Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field.
Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.
Information
-
Out of stock
- Format:Hardback
- Pages:342 pages
- Publisher:William Andrew Publishing
- Publication Date:31/12/1989
- Category:
- ISBN:9780815512004
Information
-
Out of stock
- Format:Hardback
- Pages:342 pages
- Publisher:William Andrew Publishing
- Publication Date:31/12/1989
- Category:
- ISBN:9780815512004