Test and Measurement: Know It All Paperback / softback
by Jon S. (Principal Consultant, The Dynamic Consultant, CA, USA) Wilson, Stuart (Embedded Systems consultant and author) Ball, Creed (Real-Time by Design, LLC, Raleigh, NC, USA) Huddleston, Edward (Senior Engineer, Lattice Semiconductor, Hillsboro, OR, USA) Ramsden, Dogan (Department of Computer Information Systems, Near East University) Ibrahim
Part of the Newnes Know it All series
Paperback / softback
Description
The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb.
Guaranteed not to gather dust on a shelf!Field Application engineers need to master a wide area of topics to excel.
The Test and Measurement Know It All covers every angle including Machine Vision and Inspection, Communications Testing, Compliance Testing, along with Automotive, Aerospace, and Defense testing.
Information
-
Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Paperback / softback
- Pages:912 pages
- Publisher:Elsevier Science & Technology
- Publication Date:04/11/2008
- Category:
- ISBN:9781856175302
Information
-
Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Paperback / softback
- Pages:912 pages
- Publisher:Elsevier Science & Technology
- Publication Date:04/11/2008
- Category:
- ISBN:9781856175302