Scanning Microscopies 2012 : Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences ; 24-26 April 2012, Baltimore, Maryland, United Sta Paperback / softback
by Michael T. Postek, Dale E. (National Institute of Standards and Technology, Gaithersburg, MD, USA) Newbury, S. Frank Platek
Part of the The International Society for Optical Engineering Proceedings of SPIE series
Paperback / softback
Information
-
Item not Available
- Format:Paperback / softback
- Pages:Illustrations
- Publisher:SPIE Press
- Publication Date:15/07/2012
- Category:
- ISBN:9780819490568
Information
-
Item not Available
- Format:Paperback / softback
- Pages:Illustrations
- Publisher:SPIE Press
- Publication Date:15/07/2012
- Category:
- ISBN:9780819490568