Hole-Drilling Method for Measuring Residual Stresses
Gary S. Schajer
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Introduction to Focused Ion Beam Nanometrology
David C. Cox
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Nanometrology Using Transmission Electron Microscopy
Vlad Stolojan
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Features, Challenges and Applications of Particle Image Velocimetry
Sasha Kremke
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Electronic Measurements : A Practical Approach
Farzin Asadi
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Electronic Measurements : A Practical Approach
Farzin Asadi
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Instrumentation and Sensors for Engineering Applications
Arun (University of Rhode Island Kingston USA) Shukla
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Delay Effects on Stability : A Robust Control Approach
Silviu-Iulian Niculescu
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System Design through Matlab (R), Control Toolbox and Simulink (R)
Krishna K. Singh
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Accurate Visual Metrology from Single and Multiple Uncalibrated Images
Antonio Criminisi
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Industrial Metrology : Surfaces and Roundness
Graham T. Smith
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Machine Vision for the Inspection of Natural Products
Mark Graves
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Three Dimensional Surface Topography
Ken J Stout
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Standards, Methods and Solutions of Metrology
Luigi Cocco
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Nanometrology Using the Transmission Electron Microscope
Vlad Stolojan
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Quantitative Core Level Photoelectron Spectroscopy
Juan A Colon Santana
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Sarah Fearn
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