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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Book

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Alvin W. (IBM) Strong

Format: Book (Hardback)

£163.95

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Principles of Cognitive Radio - Book

Principles of Cognitive Radio

Ezio (Universitat Pompeu Fabra, Barcelona) Biglieri

Format: Book (Hardback)

£57.99

Book (Hardback)

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