Constitutive Models for Rubber X : Proceedings of the European Conference on Constitutive Models for Rubbers X (Munich, Germany, 28-31 August 2017)
Alexander Lion
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Ullrich Pietsch
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Ullrich Pietsch
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Elements of X-Ray Diffraction: Pearson New International Edition PDF eBook
S.R. Stock
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X-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, Wurzburg, August 19-23, 1996
Jurgen Thieme
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X-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, Wurzburg, August 19-23, 1996
Jurgen Thieme
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Dynamical Theory of X-Ray Diffraction
Andre (, Universite Pierre et Marie Curie, Paris) Authier
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Dynamical Theory of X-Ray Diffraction
Andre (Professor Emeritus, Professor Emeritus, Universite Pie Authier
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Early Days of X-ray Crystallography
Andre (, Professor Emeritus at the Universite Pierre et Marie Authier
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Structure Determination by X-ray Crystallography
M. Ladd
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Structure Determination by X-Ray Crystallography
M. Ladd
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Structure Determination by X-Ray Crystallography
M. Ladd
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Structure Determination by X-Ray Crystallography
M. F. C. Ladd
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Structure Determination by X-Ray Crystallography
M. F. C. Ladd
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Structure Determination by X-Ray Crystallography
M. Ladd
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Structure Determination by X-Ray Crystallography
R.A. Palmer
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X-Ray Metrology in Semiconductor Manufacturing
D. Keith (Bede Plc, Durham, UK) Bowen
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X-Ray Diffraction by Polycrystalline Materials
Ren Guinebreti re
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X-Ray Diffraction by Polycrystalline Materials
Ren Guinebreti re
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X-Ray Metrology in Semiconductor Manufacturing
D. Keith (Bede Plc, Durham, UK) Bowen
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Industrial Applications of X-Ray Diffraction
Frank Smith
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X-Ray Diffraction by Polycrystalline Materials
Rene (Ecole Nationale Superieure de Ceramiques Industri Guinebretiere
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