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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 - Book

CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

Alexander A. (University of Texas, Austin) Demkov

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Format: Book (Paperback / softback)

£24.99

£24.05

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Electrically Based Microstructural Characterization II: Volume 500 - Book

Electrically Based Microstructural Characterization II: Volume 500

Rosario A. (Georgia Institute of Technology) Gerhardt

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Format: Book (Hardback)

£30.99

£29.65

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Electricaly-Based Microstructural Characterization: Volume 411 - Book

Electricaly-Based Microstructural Characterization: Volume 411

Edward J. (National Institute of Standards and Technology, M Garboczi

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£21.99

£20.95

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