Interferogram Analysis For Optical Testing
Zacarias Malacara
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Advanced Digital Optical Communications
Le Nguyen (Huawei Technologies, Munich, Germany) Binh
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Interferogram Analysis For Optical Testing
Zacarias Malacara
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Format: eBook (EPUB)
Advanced Digital Optical Communications
Le Nguyen (Huawei Technologies, Munich, Germany) Binh
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Format: eBook (PDF)
Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications
Manuel Servin
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Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications
Manuel Servin
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