Description
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis.
The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its
Information
-
Download - Immediately Available
- Format:PDF
- Pages:624 pages
- Publisher:CRC Press
- Publication Date:07/12/2013
- Category:
- ISBN:9781466554016
Other Formats
- Paperback / softback from £64.99
- Hardback from £185.00
Information
-
Download - Immediately Available
- Format:PDF
- Pages:624 pages
- Publisher:CRC Press
- Publication Date:07/12/2013
- Category:
- ISBN:9781466554016