Analog IC Reliability in Nanometer CMOS Hardback
by Elie Maricau, Georges Gielen
Part of the Analog Circuits and Signal Processing series
Hardback
Description
This book focuses on modeling, simulation and analysis of analog circuit aging.
First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed.
Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.
Ultimately, the impact of transistor aging on analog circuits is studied.
Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.
The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Information
-
Item not Available
- Format:Hardback
- Pages:198 pages, 16 Tables, black and white; XVI, 198 p.
- Publisher:Springer-Verlag New York Inc.
- Publication Date:09/01/2013
- Category:
- ISBN:9781461461623
Other Formats
- PDF from £76.08
- Paperback / softback from £73.75
Information
-
Item not Available
- Format:Hardback
- Pages:198 pages, 16 Tables, black and white; XVI, 198 p.
- Publisher:Springer-Verlag New York Inc.
- Publication Date:09/01/2013
- Category:
- ISBN:9781461461623
