Please note: In order to keep Hive up to date and provide users with the best features, we are no longer able to fully support Internet Explorer. The site is still available to you, however some sections of the site may appear broken. We would encourage you to move to a more modern browser like Firefox, Edge or Chrome in order to experience the site fully.

Lithium-Drifted Germanium Detectors: Their Fabrication and Use : An Annotated Bibliography, PDF eBook

Lithium-Drifted Germanium Detectors: Their Fabrication and Use : An Annotated Bibliography PDF

PDF

Please note: eBooks can only be purchased with a UK issued credit card and all our eBooks (ePub and PDF) are DRM protected.

Description

A lithium-drifted germanium detector is a semiconductor de- vice which operates at liquid nitrogen temperature, and is used for detection of nuclear radiation, mostly gamma ray.

The detection occurs when the y-ray undergoes an interaction in the intrinsic or I region of the semiconductor.

The interaction results in the pro- duction of charge carriers which are swept out by an electric field.

This is accomplished by reverse biasing the detector with approxi- mately 100 v/mm of intrinsic material.

The total amount of charge swept out is proportional to the energy dissipated in the intrinsic region.

This may include the total energy of the photon, but gen- erally somewhat less.

The Ge(Li) device is a semiconductor p-n device with a very large intrinsic region between the positive carrier region and the negative carrier region (P-I-N).

The fabrication of this device consists of three major steps: the diffusion of the lithium into the p-type germanium to give an n-type surface region, the drifting process to obtain the intrinsic region as deeply as possible, and the surface preparation.

There are numerous procedures for the various steps as well as criteria for material selection and the preparation of the materials.

Information

Other Formats

Information