Run-to-Run Control in Semiconductor Manufacturing Hardback
Edited by James (University of Michigan, Ann Arbor, USA) Moyne, Enrique (Pennsylvania State University, University Park, USA) del Castillo, Arnon M. (Friendswood, Texas, USA) Hurwitz
Hardback
Description
Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs.
Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization.
The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology.
Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
Information
-
Out of stock
- Format:Hardback
- Pages:366 pages, 27 Tables, black and white
- Publisher:Taylor & Francis Inc
- Publication Date:30/11/2000
- Category:
- ISBN:9780849311789
Information
-
Out of stock
- Format:Hardback
- Pages:366 pages, 27 Tables, black and white
- Publisher:Taylor & Francis Inc
- Publication Date:30/11/2000
- Category:
- ISBN:9780849311789