Runs and Scans with Applications Hardback
by Narayanaswamy (McMaster University, Canada) Balakrishnan, Markos V. (University Of Piraeus, Greece) Koutras
Part of the Wiley Series in Probability and Statistics series
Hardback
Description
Expert practical and theoretical coverage of runs and scans This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering.
Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems. The authors provide detailed discussions of both classical and current problems, such as: * Sooner and later waiting time * Consecutive systems * Start-up demonstration testing in life-testing experiments * Learning and memory models * "Match" in genetic codes Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.
Information
-
Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Hardback
- Pages:488 pages, Tables: 17 B&W, 0 Color; Graphs: 42 B&W, 0 Color
- Publisher:John Wiley & Sons Inc
- Publication Date:05/12/2001
- Category:
- ISBN:9780471248927
Information
-
Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Hardback
- Pages:488 pages, Tables: 17 B&W, 0 Color; Graphs: 42 B&W, 0 Color
- Publisher:John Wiley & Sons Inc
- Publication Date:05/12/2001
- Category:
- ISBN:9780471248927