Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials Hardback
by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
Part of the Springer Series in Advanced Microelectronics series
Hardback
Description
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography.
It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation.
Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography.
Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.
Numerous LIT investigation case studies are also included.
Information
-
Out of stock
- Format:Hardback
- Pages:321 pages, 68 Illustrations, color; 58 Illustrations, black and white; XXI, 321 p. 126 illus., 68 il
- Publisher:Springer International Publishing AG
- Publication Date:22/01/2019
- Category:
- ISBN:9783319998244
Other Formats
- PDF from £61.20
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- Paperback / softback from £81.69
Information
-
Out of stock
- Format:Hardback
- Pages:321 pages, 68 Illustrations, color; 58 Illustrations, black and white; XXI, 321 p. 126 illus., 68 il
- Publisher:Springer International Publishing AG
- Publication Date:22/01/2019
- Category:
- ISBN:9783319998244
