Secondary Ion Mass Spectrometry : An Introduction to Principles and Practices Hardback
by Paul van der Heide
Hardback
Description
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) * Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations * Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission * Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) * Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions * Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Information
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Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Hardback
- Pages:384 pages
- Publisher:John Wiley & Sons Inc
- Publication Date:17/10/2014
- Category:
- ISBN:9781118480489
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Information
-
Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Hardback
- Pages:384 pages
- Publisher:John Wiley & Sons Inc
- Publication Date:17/10/2014
- Category:
- ISBN:9781118480489