Progress in Nanoscale Characterization and Manipulation Paperback / softback
Edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai
Part of the Springer Tracts in Modern Physics series
Paperback / softback
Description
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences.
Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques.
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Information
-
Out of stock
- Format:Paperback / softback
- Pages:508 pages, 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 i
- Publisher:Springer Verlag, Singapore
- Publication Date:11/01/2019
- Category:
- ISBN:9789811344206
Information
-
Out of stock
- Format:Paperback / softback
- Pages:508 pages, 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 i
- Publisher:Springer Verlag, Singapore
- Publication Date:11/01/2019
- Category:
- ISBN:9789811344206
