Thermal-Aware Testing of Digital VLSI Circuits and Systems Paperback / softback
by Santanu Chattopadhyay
Paperback / softback
Description
This book aims to highlight the research activities in the domain of thermal-aware testing.
Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniquesThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Information
-
Out of stock
- Format:Paperback / softback
- Pages:118 pages
- Publisher:Taylor & Francis Ltd
- Publication Date:30/06/2020
- Category:
- ISBN:9780367607098
Other Formats
- Hardback from £56.99
- EPUB from £15.38
- PDF from £15.38
Information
-
Out of stock
- Format:Paperback / softback
- Pages:118 pages
- Publisher:Taylor & Francis Ltd
- Publication Date:30/06/2020
- Category:
- ISBN:9780367607098