Built-in-Self-Test and Digital Self-Calibration for RF SoCs Paperback / softback
by Sleiman Bou-Sleiman, Mohammed Ismail
Part of the SpringerBriefs in Electrical and Computer Engineering series
Paperback / softback
Description
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips.
The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Information
-
Item not Available
- Format:Paperback / softback
- Pages:89 pages, 7 Tables, black and white; 70 Illustrations, black and white; XVII, 89 p. 70 illus.
- Publisher:Springer-Verlag New York Inc.
- Publication Date:22/09/2011
- Category:
- ISBN:9781441995476
Other Formats
- PDF from £38.24
Information
-
Item not Available
- Format:Paperback / softback
- Pages:89 pages, 7 Tables, black and white; 70 Illustrations, black and white; XVII, 89 p. 70 illus.
- Publisher:Springer-Verlag New York Inc.
- Publication Date:22/09/2011
- Category:
- ISBN:9781441995476
