Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons Hardback

Edited by Sunil K (Univ Of California, San Diego, Usa) Sinha, Milan K (Saha Inst Of Nuclear Phys, India) Sanyal, Chun Keung (The Chinese Univ Of Hong Kong, Hong Kong) Loong

Part of the World Scientific Series in Nanoscience and Nanotechnology series

Hardback

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Description

Advanced Characterization of Nanostructured Materials - Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques.

It is intended for graduate students and researchers who might be interested in learning about and applying these methods.

The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials.

While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces.

This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples.

It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.