Please note: In order to keep Hive up to date and provide users with the best features, we are no longer able to fully support Internet Explorer. The site is still available to you, however some sections of the site may appear broken. We would encourage you to move to a more modern browser like Firefox, Edge or Chrome in order to experience the site fully.

Positron Annihilation in Semiconductors : Defect Studies, Paperback / softback Book

Positron Annihilation in Semiconductors : Defect Studies Paperback / softback

Part of the Springer Series in Solid-State Sciences series

Paperback / softback

Description

The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation.

A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described.

The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.

The most prominent results obtained with positrons in practically all important semiconductors are reviewed.

A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes.

The theoretical background necessary to understand the experimental results is explained in detail.

Information

Other Formats

Save 5%

£179.99

£169.35

 
Free Home Delivery

on all orders

 
Pick up orders

from local bookshops

Information

Also in the Springer Series in Solid-State Sciences series  |  View all