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Electron Microscopy and Analysis 2001, PDF eBook

Electron Microscopy and Analysis 2001 PDF

Edited by M. Aindow, C. J. (Department of Engineering, University of Liverpool, UK) Kiely

Part of the Institute of Physics Conference Series series

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Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists.

Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies.

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