Progress in Nanoscale Characterization and Manipulation Hardback
Edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai
Part of the Springer Tracts in Modern Physics series
Hardback
Description
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences.
Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques.
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Information
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Out of stock
- Format:Hardback
- Pages:508 pages, 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 i
- Publisher:Springer Verlag, Singapore
- Publication Date:14/09/2018
- Category:
- ISBN:9789811304538
Information
-
Out of stock
- Format:Hardback
- Pages:508 pages, 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 i
- Publisher:Springer Verlag, Singapore
- Publication Date:14/09/2018
- Category:
- ISBN:9789811304538