Understanding Robust and Exploratory Data Analysis
David C. (Harvard University, MA and ABT Associates Inc.) Hoaglin
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David A. Eberth
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Add to BasketLow Voltage Electron Microscopy : Principles and Applications
David C. Bell
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Low Voltage Electron Microscopy : Principles and Applications
David C. Bell
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Low Voltage Electron Microscopy : Principles and Applications
David C. (Harvard University) Bell
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Add to BasketBeam-Solid Interactions for Materials Synthesis and Characterization: Volume 354
Tony F. (Columbia University, New York) Heinz
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