Surface/Interface and Stress Effects in Electronic Materials Nanostructures: Volume 405 Hardback
Edited by R. C. (The Johns Hopkins University) Cammarata, A. (University of Maryland, College Park) Christou, S. M. Prokes, K. L. (University of California, Los Angeles) Wang
Part of the MRS Proceedings series
Hardback
Description
This book addresses the importance of surface and stresses, particularly in the realm of decreasing structure size, where surface-to-volume ratio increases significantly. In these nanoscale systems, the surface properties and stresses become a critical issue when considering the resulting physical properties. The book also focuses on the use of novel experimental techniques capable of measuring these properties on a micron or submicron scale, including local stress mapping and localized surface chemistry determination.
Topics include: the effects of strain on electronic and vibrational properties of semiconductor structures; nanostructure formation - growth and stress effects; fabricated nanostructures - stress effects; porous silicon - materials and optical properties; deposition and surface properties of semiconductor nanostructures; semiconductor interfaces; materials characterization - X-ray and strain measurements; materials characterization - surface passivation and structural defect studies; and metal, ceramic and polymer nanostructures.
Information
-
Item not Available
- Format:Hardback
- Pages:546 pages, Worked examples or Exercises
- Publisher:Materials Research Society
- Publication Date:09/09/1996
- Category:
- ISBN:9781558993082
Information
-
Item not Available
- Format:Hardback
- Pages:546 pages, Worked examples or Exercises
- Publisher:Materials Research Society
- Publication Date:09/09/1996
- Category:
- ISBN:9781558993082
