Digital Circuit Testing : A Guide to DFT and Other Techniques PDF
by Francis C. Wong
Description
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes.
New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods.
Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG).
This book will provide a practical introduction to these and other testing techniques.
For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Information
-
Download - Immediately Available
- Format:PDF
- Pages:228 pages
- Publisher:Elsevier Science
- Publication Date:02/12/2012
- Category:
- ISBN:9780080504346
Information
-
Download - Immediately Available
- Format:PDF
- Pages:228 pages
- Publisher:Elsevier Science
- Publication Date:02/12/2012
- Category:
- ISBN:9780080504346
