Please note: In order to keep Hive up to date and provide users with the best features, we are no longer able to fully support Internet Explorer. The site is still available to you, however some sections of the site may appear broken. We would encourage you to move to a more modern browser like Firefox, Edge or Chrome in order to experience the site fully.

Showing 1 - 7 (of 7)
Refine
Noise Contamination in Nanoscale VLSI Circuits - Book

Noise Contamination in Nanoscale VLSI Circuits

Selahattin Sayil

Format: Book (Paperback / softback)

£44.99

£37.09

Book (Paperback / softback)

Add to Basket
Soft Error Mechanisms, Modeling and Mitigation - Book

Soft Error Mechanisms, Modeling and Mitigation

Selahattin Sayil

Format: Book (Hardback)

£64.99

£53.95

Book (Hardback)

Item not Available
Soft Error Mechanisms, Modeling and Mitigation - eBook

Soft Error Mechanisms, Modeling and Mitigation

Selahattin Sayil

Format: eBook (PDF)

£44.99

£38.24

eBook (PDF)

Add to Basket
Noise Contamination in Nanoscale VLSI Circuits - Book

£44.99

£37.09

Book (Hardback)

Add to Basket
Contactless VLSI Measurement and Testing Techniques - Book

Contactless VLSI Measurement and Testing Techniques

Selahattin Sayil

Format: Book (Hardback)

£109.99

£95.55

Book (Hardback)

Item not Available
Soft Error Mechanisms, Modeling and Mitigation - Book

Soft Error Mechanisms, Modeling and Mitigation

Selahattin Sayil

Format: Book (Paperback / softback)

£44.99

Book (Paperback / softback)

Add to Basket
Contactless VLSI Measurement and Testing Techniques - Book

Contactless VLSI Measurement and Testing Techniques

Selahattin Sayil

Format: Book (Paperback / softback)

£109.99

£95.65

Book (Paperback / softback)

Item not Available
Showing 1 - 7 (of 7)
Refine