Delay Fault Testing for VLSI Circuits
Angela Krstic
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Formal Equivalence Checking and Design Debugging
Shi-Yu Huang
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Multi-Chip Module Test Strategies
Yervant Zorian
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Introduction to Advanced System-on-Chip Test Design and Optimization
Erik Larsson
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Fault Diagnosis of Analog Integrated Circuits
Prithviraj Kabisatpathy
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Fault Diagnosis of Analog Integrated Circuits
Prithviraj Kabisatpathy
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Data Mining and Diagnosing IC Fails
Leendert M. Huisman
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Advances in Electronic Testing : Challenges and Methodologies
Dimitris Gizopoulos
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Advances in Electronic Testing : Challenges and Methodologies
Dimitris Gizopoulos
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The Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500 (TM)
Francisco Da Silva
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Fault-Tolerance Techniques for SRAM-Based FPGAs
Fernanda Lima Kastensmidt
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Digital Timing Measurements : From Scopes and Probes to Timing and Jitter
Wolfgang Maichen
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Digital Timing Measurements : From Scopes and Probes to Timing and Jitter
Wolfgang Maichen
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The Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500(TM)
Francisco da Silva
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Defect-oriented Testing for Nano-metric CMOS VLSI Circuits
Manoj Sachdev
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev
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Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability
Mohammad Tehranipoor
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Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability
Mohammad Tehranipoor
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Formal Equivalence Checking and Design Debugging
Shi-Yu Huang
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Design for AT-Speed Test, Diagnosis and Measurement
Benoit Nadeau-Dostie
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