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Design for AT-Speed Test, Diagnosis and Measurement
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Efficient Branch and Bound Search with Application to Computer-Aided Design
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From Contamination to Defects, Faults and Yield Loss : Simulation and Applications
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Design for AT-Speed Test, Diagnosis and Measurement
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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
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Power-Constrained Testing of VLSI Circuits : A Guide to the IEEE 1149.4 Test Standard
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Fault Diagnosis of Analog Integrated Circuits
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Fault Diagnosis of Analog Integrated Circuits
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Data Mining and Diagnosing IC Fails
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Advances in Electronic Testing : Challenges and Methodologies
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Advances in Electronic Testing : Challenges and Methodologies
Dimitris Gizopoulos
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