Radiation Effects in Advanced Semiconductor Materials and Devices
C. Claeys
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£112.49
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Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact
Cor Claeys
Out of stock
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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Brandon Noia
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£99.99
£81.35
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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
Krishnendu Chakrabarty
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£129.99
£112.49
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Extended Defects in Germanium : Fundamental and Technological Aspects
Cor Claeys
Out of stock
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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Brandon Noia
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£79.99
£65.85
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Book (Paperback / softback)
Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact
Cor Claeys
Out of stock
Format: Book (Paperback / softback)
Extended Defects in Germanium : Fundamental and Technological Aspects
Cor Claeys
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£179.99
£154.85
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Book (Paperback / softback)